CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

CHE Jitai; ZHANG Wanxi

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CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

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- CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS
- role： First author , 第一作者 ,
  
  Affiliation：
  Changchun Institute of Applied Chemistry, Academia Sinica,Changchun
  
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  CHE Jitai ZHANG Wanxi
  ,
  role：
  
  Affiliation：
  Changchun Institute of Applied Chemistry, Academia Sinica,Changchun
  
  Email：
  
  No information about the author is available
  张万喜
  ,
- Vol. 8, Issue 4, Pages: 359-362(1990)
- Affiliations：
  
  1. Changchun Institute of Applied Chemistry, Academia Sinica,Changchun
  2. Academia Sinica
  3. Academia Sinica Changchun
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CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS. [J]. 8(4):359-362(1990)
DOI：

CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS. [J]. 8(4):359-362(1990) DOI：

Abstract

In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C_1s there is a photoelectron peak at 289.0 eV that appears to be C_1s of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

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摘要

<,正,>, In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C,1s, there is a photoelectron peak at 289.0 eV that appears to be C,1s, of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

Abstract

In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C,1s, there is a photoelectron peak at 289.0 eV that appears to be C,1s, of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

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