CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

CHE Jitai; ZHANG Wanxi

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CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

Papers | Updated：2021-06-21

- CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS
- Vol. 8, Issue 4, Pages: 359-362(1990)
- Affiliations：
  
  1. Changchun Institute of Applied Chemistry, Academia Sinica,Changchun
  2. Academia Sinica
  3. Academia Sinica Changchun
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CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS. [J]. 8(4):359-362(1990)
DOI：

CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS. [J]. 8(4):359-362(1990) DOI：

摘要

<,正,>, In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C,1s, there is a photoelectron peak at 289.0 eV that appears to be C,1s, of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

Abstract

In this work, characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C,1s, there is a photoelectron peak at 289.0 eV that appears to be C,1s, of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

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