Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals

Yi-ning He; Xiao Liu; Qi Liao; Jian-jun Zhou; Hong Huo; Lin Li

doi:10.1007/s10118-014-1504-z

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Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals

Updated：2021-06-21

- Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals
- Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals
- Chinese Journal of Polymer Science 2014年32卷第9期页码：1253-1259
- Affiliations：
  
  a.Beijing Key Laboratory of Energy Transition and Storage Materials, College of Chemistry, Beijing Normal University, Beijing 100875, China
  b.Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
- Author bio：
  
  **Jian-jun Zhou (周建军), E-mail: pla_zjj@bnu.edu.cn
- Funds：
  
  Natural Science Foundation of China(20634050;20804053;21074015);Science Foundation of Beijing(212030);National Basic Research Program of China(2011CB605605);Fundamental Research Funds for the Central Universities
- DOI：10.1007/s10118-014-1504-z
  中图分类号：
- 收稿：2014-04-17，
  
  修回：2014-05-12，
  
  录用：2014-05-16，
  
  纸质出版：2014-09
- Accepted：
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Yi-ning He, Xiao Liu, Qi Liao, 等. Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals[J]. Chinese Journal of Polymer Science, 2014,32(9):1253-1259.

Yi-ning He, Xiao Liu, Qi Liao, et al. Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals[J]. Chinese Journal of Polymer Science, 2014, 32(9): 1253-1259.
Yi-ning He, Xiao Liu, Qi Liao, 等. Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals[J]. Chinese Journal of Polymer Science, 2014,32(9):1253-1259. DOI： 10.1007/s10118-014-1504-z.

Yi-ning He, Xiao Liu, Qi Liao, et al. Thickness-dependent Orientation Structure in Poly(ethylene oxide) Multi-layer Crystals[J]. Chinese Journal of Polymer Science, 2014, 32(9): 1253-1259. DOI： 10.1007/s10118-014-1504-z.

摘要

Abstract

Poly(ethylene oxide) multi-layer crystals were obtained and the re-crystallization behavior was studied to give insight into how melt thickness and temperature affect the lamellar orientation. For a special re-crystallization temperature

there exists a critical transition thickness range for the occurrence of edge-on lamellar orientation. Below the critical thickness

only flat-on lamellae were observed. While above the critical thickness

both flat-on and edge-on lamellae were found and the proportion of the edge-on lamellae increases with thickness. At low re-crystallization temperatures (below 30 ℃)

the critical transition thickness gradually increases from about 15 nm to 35 nm when the re-crystallization temperature was increased from 20 ℃ to 30 ℃. However

when the re-crystallization temperature is above 30 ℃

the critical transition thickness becomes constant. Our results demonstrated that the lamellar orientation could be specially modified by changing the melt thickness and re-crystallization temperature.

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