A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS

Xiao-fang Liu; Shuai-xia Tan; Xiao-li Zhang; Ning Zhao; Jian Xu

doi:10.1007/s10118-013-1294-8

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A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS

PAPER | Updated：2023-01-03

- A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS
- A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS
- Chinese Journal of Polymer Science 2013年31卷第7期页码：1022-1028
- Affiliations：
  
  a.Beijing National Laboratory of Molecular Science, Laboratory of Polymer Physics and Chemistry, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
  b.Graduate University of the Chinese Academy of Sciences, Beijing 100049, China
- Author bio：
  
  **Ning Zhao (赵宁), E-mail: zhaoning@iccas.ac.cn
  Jian Xu (徐坚), E-mail: jxu@iccas.ac.cn
- Funds：
  
  NSFC(201121001)
- DOI：10.1007/s10118-013-1294-8
  中图分类号：
- 收稿：2012-08-24，
  
  修回：2012-10-29，
  
  录用：2012-10-31，
  
  纸质出版：2013-07
- Accepted：
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Xiao-fang Liu, Shuai-xia Tan, Xiao-li Zhang, 等. A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS[J]. Chinese Journal of Polymer Science, 2013,31(7):1022-1028.

Xiao-fang Liu, Shuai-xia Tan, Xiao-li Zhang, et al. A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS[J]. Chinese Journal of Polymer Science, 2013, 31(7): 1022-1028.
Xiao-fang Liu, Shuai-xia Tan, Xiao-li Zhang, 等. A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS[J]. Chinese Journal of Polymer Science, 2013,31(7):1022-1028. DOI： 10.1007/s10118-013-1294-8.

Xiao-fang Liu, Shuai-xia Tan, Xiao-li Zhang, et al. A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS[J]. Chinese Journal of Polymer Science, 2013, 31(7): 1022-1028. DOI： 10.1007/s10118-013-1294-8.

摘要

Abstract

A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previous reports

which only compare the ESPI experimental and FEM simulated results at several points or lines

herein the full-field FEM results were exported

subtracted with a continuous distribution. By choosing proper parameters and number of substeps

the simulated and experimental results showed excellent correspondence. Furthermore

the displacement fields vertical to the tensional direction were also presented

and the strain field was preliminarily evaluated. The current method of combination of ESPI and FEM allows for capturing the experimental fringe maps to validate and optimize FEM results simulated

and would give a higher security to structural and mechanical analysis of polymeric materials.

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