STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS

徐君庭

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STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS

Updated：2021-06-21

- STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS
- STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS
- 高分子科学（英文版） 2006年第4期页码：341-344
- Affiliations：
  
  Key Laboratory of Macromolecule Synthesis and Functionalization Department of Polymer Science & Engineering Zhejiang University Hangzhou China ,310027
- Author bio：
- Funds：
  
  This project was supported by the National Natural Science Foundation of China （No. 20374046） the Excellent Young Teachers Program and New Century Supporting Program for the Talents by Ministry of Education.()
- DOI：
  中图分类号： O631.3
- 纸质出版：2006
- Accepted：
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[1]徐君庭.STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS[J].Chinese Journal of Polymer Science,2006(04):341-344.

STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS[J]. 2006, (4): 341-344.
[1]徐君庭.STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS[J].Chinese Journal of Polymer Science,2006(04):341-344. DOI：

STRUCTURE OF CRYSTALLINE DOMAINS IN SEMICRYSTALLINE BLOCK COPOLYMER THIN FILMS[J]. 2006, (4): 341-344. DOI：

摘要

<正>Thin film morphology of a symmetric semicrystalline oxyethylene/oxybutylene diblock copolymer （E76B38） on silicon was investigated by tapping mode atomic force microscopy （AFM）. It is found that the nascent thin film is composed of multiple polymer layers having mixed thicknesses of L≈L0 and L≈L0/2 （L0 is the long period of the block copolymer in bulk） besides the first layer near the substrate. This shows that the crystalline domain in the block copolymer consists of double poly（oxyethylene） layers. Annealing leads to disappearance of the polymer layers with thickness L≈L0/2

indicating that such polymer layers are metastable.

Abstract

Thin film morphology of a symmetric semicrystalline oxyethylene/oxybutylene diblock copolymer （E76B38） on silicon was investigated by tapping mode atomic force microscopy （AFM）. It is found that the nascent thin film is composed of multiple polymer layers having mixed thicknesses of L≈L0 and L≈L0/2 （L0 is the long period of the block copolymer in bulk） besides the first layer near the substrate. This shows that the crystalline domain in the block copolymer consists of double poly（oxyethylene） layers. Annealing leads to disappearance of the polymer layers with thickness L≈L0/2

indicating that such polymer layers are metastable.

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