OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*

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OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*

Papers | Updated：2021-06-21

- OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*
- OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*
- 高分子科学（英文版） 2004年22卷第2期页码：117-122
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- 纸质出版：2004-04-20
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OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 高分子科学（英文版）, 2004,22(2):117-122.

OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 2004, 22(2): 117-122.
OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 高分子科学（英文版）, 2004,22(2):117-122. DOI：

OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 2004, 22(2): 117-122. DOI：

摘要

Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes

at low concentrations

can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution.The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present.

Abstract

Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes

at low concentrations

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