CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

CHE Jitai; ZHANG Wanxi

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CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS

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- CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS
- CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS
- 高分子科学（英文版） 1990年8卷第4期页码：359-362
- Affiliations：
  
  1. Changchun Institute of Applied Chemistry, Academia Sinica,Changchun
  2. Academia Sinica
  3. Academia Sinica Changchun
- Author bio：
- Funds：
- DOI：
  中图分类号：
- 纸质出版：1990-12-20
- Accepted：
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[1]车吉泰,张万喜.CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS[J].Chinese Journal of Polymer Science,1990,{4}(04):359-362.

CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS[J]. 1990, 8(4): 359-362.
[1]车吉泰,张万喜.CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS[J].Chinese Journal of Polymer Science,1990,{4}(04):359-362. DOI：

CHE Jitai, ZHANG Wanxi. CHARACTERIZATION OF RADIATION GRAFTING DEGREE OF POLYSTYRENEg-ACRYLIC ACID BY XPS[J]. 1990, 8(4): 359-362. DOI：

摘要

正

In this work

characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C

there is a photoelectron peak at 289.0 eV that appears to be C

of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

Abstract

In this work

characterization of radiation grafting degree of polystyrene-g-acrylic acid by XPS was studied. It is found that along with the main peak C

there is a photoelectron peak at 289.0 eV that appears to be C

of-（?）-OH group and shows the presence ofpolyacrylic acid grafted on the polystyrene The grafting degree obtained by XPS is in agreement with that from the gravimetric method.

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