X-ray diffraction analysis and IR analysis. The results indicate that the phenomenon of double melting peaks during DSC analysis is due to the partial melting and recrystallization of the crystallite at the moment of thermal scanning. The lower temperature peak
which varies slightly according to annealing condition
corresponds to the melting of imperfect crystallite
and the higher temperature peak corresponds to the melting of better organized crystallite.In the course of temperature scanning
the unit cell parameters of PET remains unchanged while the crystals turn to better crystal lattice
greater crystal size and more regular folding.We also found that there is a slight reduction in crystal size between the two melting peaks
and an explanation is suggested for this phenomenon.
Abstract
Three sets of PET samples
comprising original (undrawn)
uniaxially drawn and biaxially ones
after annealed at 230°
240° and 250℃ respectively
were subjected to DSC thermal analysis
X-ray diffraction analysis and IR analysis. The results indicate that the phenomenon of double melting peaks during DSC analysis is due to the partial melting and recrystallization of the crystallite at the moment of thermal scanning. The lower temperature peak
which varies slightly according to annealing condition
corresponds to the melting of imperfect crystallite
and the higher temperature peak corresponds to the melting of better organized crystallite.In the course of temperature scanning
the unit cell parameters of PET remains unchanged while the crystals turn to better crystal lattice
greater crystal size and more regular folding.We also found that there is a slight reduction in crystal size between the two melting peaks
and an explanation is suggested for this phenomenon.
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