OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*

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OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*

Papers | Updated：2021-06-21

- OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*
- Vol. 22, Issue 2, Pages: 117-122(2004)
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- Published：20 April 2004
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OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 2004, 22(2): 117-122.
DOI：

OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. 2004, 22(2): 117-122. DOI：

摘要

Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes

at low concentrations

can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution.The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present.

Abstract

Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes

at low concentrations

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