APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM*

ZHANG Hongfang; YU Li; ZHANG Lihua; MO Zhishen; MU Zhongchen

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APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM*

Papers | Updated：2021-06-21

- APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM*
- Vol. 13, Issue 3, Pages: 210-217(1995)
- Affiliations：
  
  1.   Polymer Physics Laboratory
  2.   Changchun Institute of Applied Chemistry
  3.   Academia Sinica
  4.   Changchun 130022
  5.   The Centre of Analysis and Measurement
  6.   Northeast Normal University
  7.   Changchun 130021
- Author bio：
- Funds：
- DOI：
  CLC： TQ323.6
- Published：20 September 1995
- Accepted：
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[1]张宏放,于力,张利华,莫志深,牟忠诚.APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM[J].Chinese Journal of Polymer Science,1995,{4}(03):210-217.

ZHANG Hongfang, YU Li, ZHANG Lihua, et al. APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM*[J]. 1995, 13(3): 210-217.
[1]张宏放,于力,张利华,莫志深,牟忠诚.APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM[J].Chinese Journal of Polymer Science,1995,{4}(03):210-217. DOI：

ZHANG Hongfang, YU Li, ZHANG Lihua, et al. APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM*[J]. 1995, 13(3): 210-217. DOI：

摘要

<正> Pure X-ray diffraction profiles have been analysed for polyamide 1010 and PA1010--BMI system by means of multipeak fitting resolution of X-ray diffraction.The methods ofvariance and fourth moment have been applied to determine the particle size and strainvalues for theparacrystalline materials.The results indicated that both variance and fourthmoment of X-ray diffraction line profile yielded approximately the same values of theparticle size and the strain.The particle sizes of（100）reflection have been found todecrease with increasing BMI content

whereas the strain values increased.

Abstract

Pure X-ray diffraction profiles have been analysed for polyamide 1010 and PA1010--BMI system by means of multipeak fitting resolution of X-ray diffraction.The methods ofvariance and fourth moment have been applied to determine the particle size and strainvalues for theparacrystalline materials.The results indicated that both variance and fourthmoment of X-ray diffraction line profile yielded approximately the same values of theparticle size and the strain.The particle sizes of（100）reflection have been found todecrease with increasing BMI content

whereas the strain values increased.

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